/ Journals / Foreign Economics & Management
Foreign Economics & Management
LiZengquan, Editor-in-Chief
ZhengChunrong, Vice Executive Editor-in-Chief
YinHuifang HeXiaogang LiuJianguo, Vice Editor-in-Chief
Editorial Board  |  Read more about this journal »
AboutAll IssuesAuthors GuidePeer ReviewSubscribeContact Us
Home  >  All Issues  >  1986  >  No.04  >  Article Details
预测技术发展趋势的新工具—专利分析
N/A
Full Article  |  PDF Article
Foreign Economics & Management Vol. 08, Issue 04, pp. 10 - 11 (1986)
Abstract
References
Abstract
Keywords
Cite this article
迟少杰. 预测技术发展趋势的新工具—专利分析[J]. Foreign Economics & Management, 1986, 8(4): 10–11. 
Export Citations as: For   
Previous: No title
Next: No title
ISSUE COVER
1986, Issue 04
RELATED ARTICLES
Causality of Institutions on Prosperity and Dynamic Game Analysis of Institutional Change: A Review of Main Contributions by 2024 Nobel Economics Laureates
Li Baoliang, Guo Qiyou, Zheng Wenzhi
Big Data Audit: Theoretical Framework, Research Progress, and Future Prospects
Xu Ronghua, Zhu Jing, Dai Xinyu
Secret Consumption: A Review and Prospects
Xu Huan, You Tingting, Zhang Min, et al
“Sound” Touches Hearts: The Marketing Effect, Mechanism, and Automatic Extraction Technique of Audio
Ran Yaxuan, Dong Linkang, Huang Yuting, et al
The Effect of the Match between Celebrity Spokespersons and Victims on Donation
Zhu Huawei, Li Yanni, He Bin
Digital Technology Application and Innovation Efficiency Improvement
Yang Peng, Yin Zhifeng, Sun Baowen
A Review of Value Creation in Digital Industry Innovation Ecosystems
Qiu Rui, Yu Peili, Wang Cengceng
Development of Digital Finance and Optimization of Skilled Labor Structure
Hu Yue, Zhang Hanmeng
Can Government Digital Procurement Promote the Outward Foreign Direct Investment of Enterprises?
Tan Weijie, Shen Minghao, Liu Yiqian
Communication Framing in Digital Transformation: Mechanisms and Boundary Conditions of Opportunity and Threat Framing Affecting Employees’ Technology Adoption
Dong Yuntao, Tang Mingyue, Chen Xiaoxuan
Journals  |   Articles  |   Submission  |   Subscribe  |   Contact us
Copyright 2024 © Department of Academic Journals, SUFE    No. 321 Guoding Rd, Shanghai, China    P.O: 200433